Würselen, Germany

Bernd Reichenberg

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Aixacct Systems Gmbh, Rwth Aachen. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bernd Reichenberg. Retrieved from https://idiyas.com/inventor/bernd-reichenberg

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

 

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Bernd Reichenberg: Innovator in Charge Carrier Beam Technology

Introduction

Bernd Reichenberg is a notable inventor based in Würselen, Germany. He has made significant contributions to the field of charge carrier beam technology. His innovative approach has led to the development of a unique method for determining beam parameters, which has implications for various applications in the industry.

Latest Patents

Reichenberg holds a patent for a "Method for determining beam parameters of a charge carrier beam, measuring device, and charge carrier beam device." This patent describes a method that involves guiding a charge carrier beam through a slit aperture arrangement. The measurement plane coordinates of the beam components that penetrate the slit aperture are determined, allowing for precise measurement of beam parameters.

Career Highlights

Throughout his career, Bernd Reichenberg has worked with prominent organizations, including RWTH Aachen and Aixacct Systems GmbH. His experience in these institutions has contributed to his expertise in the field of charge carrier beams and measurement devices.

Collaborations

Reichenberg has collaborated with various professionals in his field, including Jens De Vries. These partnerships have enhanced his research and development efforts, leading to advancements in charge carrier beam technology.

Conclusion

Bernd Reichenberg's contributions to the field of charge carrier beam technology are noteworthy. His innovative methods and collaborations have paved the way for advancements in measurement devices. His work continues to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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