Company Filing History:
Years Active: 2010
Title: Bernd Jungmann: Innovator in Defect Detection Technology
Introduction
Bernd Jungmann is a notable inventor based in Marburg, Germany. He has made significant contributions to the field of semiconductor technology, particularly in the area of defect detection. His innovative approach has led to the development of a unique method that enhances the accuracy of image comparisons.
Latest Patents
One of Bernd Jungmann's key patents is titled "Detecting defects by three-way die-to-die comparison with false majority determination." This patent describes a method for determining defects in a plurality of images that have essentially the same image contents. The process involves conducting a comparison operation once three fully comparable images are available in the intermediate memory. The individual images are accessed randomly, and a paired comparison operation is performed between the three difference images. This innovative technique aims to improve the reliability of defect detection in semiconductor manufacturing.
Career Highlights
Bernd Jungmann is currently employed at Vistec Semiconductor Systems GmbH, where he applies his expertise in semiconductor technology. His work focuses on enhancing the quality and efficiency of semiconductor manufacturing processes. With a patent portfolio that includes 1 patent, he has established himself as a valuable contributor to the field.
Collaborations
Throughout his career, Bernd has collaborated with several talented professionals, including Detlef Michelsson and Steffen Gerlach. These collaborations have fostered an environment of innovation and have contributed to the advancement of semiconductor technologies.
Conclusion
In summary, Bernd Jungmann is a distinguished inventor whose work in defect detection technology has made a significant impact in the semiconductor industry. His innovative methods and collaborations continue to drive advancements in this critical field.