This inventor holds 2 USPTO granted patents. Top assignee: U.S. Philips Corporation. Active years: 1988.
Company Filing History:
Years Active: 1988
Title: Bernd Heck: Innovator in Measuring Technology
Introduction
Bernd Heck is a notable inventor based in Hamburg, Germany. He has made significant contributions to the field of measuring technology, particularly through his innovative designs and patents. With a total of 2 patents, his work has had a considerable impact on the industry.
Latest Patents
Heck's latest patents include an oscillator having an all-pass filter with a resistance bridge for detecting various physical parameters. This measuring oscillator features a current source with a controllable amplification factor, ensuring that the amplitude of the alternating voltage remains constant. The all-pass filter comprises a phase-determining bipolar circuit, which allows for precise measurements of frequency variations based on changes in physical parameters.
Another significant patent is an oscillator specifically designed for measuring temperature. This device also utilizes an all-pass filter and a current source with a controllable amplification factor. The design allows for small temperature variations to produce large, measurable changes in the frequency of the measuring oscillator, enhancing its sensitivity and accuracy.
Career Highlights
Bernd Heck is currently employed at U.S. Philips Corporation, where he continues to develop innovative measuring technologies. His work at this esteemed company has allowed him to collaborate with other talented professionals in the field, further advancing the state of measuring technology.
Collaborations
One of his notable coworkers is Dierk Schroder, with whom he has likely shared insights and expertise in their joint efforts to innovate within the industry.
Conclusion
Bernd Heck's contributions to measuring technology through his patents and work at U.S. Philips Corporation highlight his role as a significant inventor in the field. His innovative designs continue to influence the way physical parameters are measured, showcasing the importance of his work.
