Coye-La-Foret, France

Bernard Fondeur

This inventor holds 1 USPTO granted patent. Top assignee: D.e.a. Digital Electronic Automation S.p.a.. Active years: 1989.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bernard Fondeur. Retrieved from https://idiyas.com/inventor/bernard-fondeur

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 1989

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1 patent (USPTO):Explore Patents

Title: The Innovations of Bernard Fondeur

Introduction

Bernard Fondeur is a notable inventor based in Coye-La-Foret, France. He has made significant contributions to the field of measurement technology, particularly through his innovative use of laser interferometry. His work has implications for various industries that require precise measurement techniques.

Latest Patents

Fondeur holds a patent for a "Measuring device employing laser interferometry." This device features a tracking mechanism for mobile targets, strategically positioned between a light source and a semireflecting mirror. This design aims to eliminate inaccuracies that may arise from the construction of the measuring device, enhancing its reliability and precision.

Career Highlights

Bernard Fondeur is associated with D.E.A. Digital Electronic Automation S.p.A., where he applies his expertise in electronic automation and measurement technologies. His role in the company allows him to further develop and refine his inventions, contributing to advancements in the field.

Collaborations

Due to space constraints, the details of Fondeur's collaborations will not be included.

Conclusion

Bernard Fondeur's innovative work in laser interferometry exemplifies the importance of precision in measurement technology. His contributions continue to influence the industry and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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