Stamford, CT, United States of America

Benjamin J Green

This inventor holds 1 USPTO granted patent. Top assignee: Stanley Black & Decker, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Benjamin J Green. Retrieved from https://idiyas.com/inventor/benjamin-j-green

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Benjamin J. Green and a Retractable Tape Measure Innovation

Introduction

Benjamin J. Green is an inventor associated with Stamford, Connecticut, and Stanley Black & Decker, Inc. His listed patent concerns a retractable tape measure designed to make extending its blade easier.

Latest Patents

Green’s listed invention is “Tape Measure with Pop Out Blade Presentation.” The retractable rule assembly includes a housing, a reel, an elongated measuring blade, a hook, a coil spring, and a manually operated blade advancer. The blade is wound around the reel and extends through an opening in the housing, while the spring turns the reel to retract it. The advancer can be moved against the spring’s bias to push the blade outward. Green is credited with 1 patent.

Career Highlights

Green’s patent reflects work on improving the usability of a familiar measuring tool. Its blade-advancing mechanism provides a way to extend the tape manually while working against the force that normally retracts it. The supplied information associates Green with Stanley Black & Decker, Inc.

Collaborations

Gregory Cyr and Somen Rajkumar Jaiswal are identified as Green’s coworkers. The available information does not specify their roles in the patent or whether they collaborated on this invention.

Conclusion

Benjamin J. Green’s listed patent focuses on a practical tape-measure mechanism that helps users advance a retractable blade from its housing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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