Company Filing History:
Years Active: 2010
Title: Innovations of Benjamin J Brosilow
Introduction
Benjamin J Brosilow is an accomplished inventor based in Ramat Yishay, Israel. He is known for his significant contributions to the field of measurement technology. His innovative work focuses on developing apparatuses and methods that enhance the accuracy of reflectivity measurements.
Latest Patents
Brosilow holds a patent for a "Reflectivity/emissivity measurement probe insensitive to variations in probe-to-target distance." This invention provides a solution for accurately measuring the reflectivity of a target surface, even when the distance between the measuring probe and the target is not fixed. The method involves taking at least two measurements of the target reflectivity under different conditions. These measurements are then combined to calculate the target reflectivity in a manner that is independent of the probe-to-target distance. The different conditions ensure that each measurement samples radiation reflected from the target surface at varying angles. Additionally, the apparatus can accurately measure the distance between the probe measurement head and the target surface.
Career Highlights
Brosilow is currently employed at Ci Systems Ltd., where he continues to innovate and develop advanced measurement technologies. His work has had a significant impact on the industry, showcasing his expertise and dedication to improving measurement accuracy.
Collaborations
Brosilow collaborates with Yoram Naor, contributing to the advancement of their projects and enhancing the capabilities of their inventions.
Conclusion
Benjamin J Brosilow's innovative work in measurement technology exemplifies the importance of accuracy in scientific applications. His patent reflects a significant advancement in the field, demonstrating his commitment to innovation and excellence.