This inventor holds 1 USPTO granted patent. Top assignee: Advanced Micro Devices Corporation. Active years: 2011.
Company Filing History:
Years Active: 2011
Title: The Innovations of Benjamin Ertle
Introduction
Benjamin Ertle is an accomplished inventor based in Austin, TX. He has made significant contributions to the field of technology, particularly in the area of device testing and analysis. His innovative approach has led to the development of a unique patent that addresses critical challenges in the industry.
Latest Patents
Benjamin Ertle holds a patent titled "Method and apparatus for identifying outliers following burn-in testing." This patent describes a method that includes performing burn-in testing of a device in a tester to generate post burn-in data. The pre-burn-in data associated with the device is compared to the post burn-in data. Based on this comparison, the device is identified as an outlier device. This innovation is crucial for ensuring the reliability and performance of electronic devices.
Career Highlights
Ertle is currently employed at Advanced Micro Devices Corporation, a leading company in the semiconductor industry. His work at AMD has allowed him to apply his inventive skills in a practical setting, contributing to the advancement of technology. With a total of 1 patent, he has established himself as a valuable asset to his team and the company.
Collaborations
Throughout his career, Benjamin has collaborated with talented individuals such as Rajesh Vijayaraghavan and Paul A. Ferno. These collaborations have fostered an environment of innovation and creativity, leading to the development of groundbreaking technologies.
Conclusion
In summary, Benjamin Ertle is a notable inventor whose work has made a significant impact in the field of device testing. His patent for identifying outliers following burn-in testing showcases his innovative thinking and dedication to improving technology. His contributions at Advanced Micro Devices Corporation further highlight his importance in the industry.
