Benjamin Edward Floering

Title: The Innovations of Benjamin Edward Floering

Introduction

Benjamin Edward Floering is a notable inventor based in Durham, NC (US). He has made significant contributions to the field of integrated circuits, particularly in the area of scan chain connectivity. His innovative approach has led to advancements in test coverage for functional logic units.

Latest Patents

Floering holds a patent for "Scan chain connectivity." This invention focuses on the design of scan chains for integrated circuits, which are essential for ensuring test coverage of functional logic units. Before the physical placement of the scan circuit elements, attributes are assigned to define which elements must remain coupled and which groups should stay together. The placement data is then used to determine the location of these elements. Using the scan attributes, Floering's method allows for the reallocation of single scan circuit elements and sub-scan chains across new scan chains, optimizing the wiring through an algorithm that minimizes scan path lengths.

Career Highlights

Floering is associated with International Business Machines Corporation (IBM), where he has been able to apply his expertise in integrated circuit design. His work has contributed to the development of more efficient testing methods for complex electronic systems.

Collaborations

Throughout his career, Floering has collaborated with esteemed colleagues such as Robert Glen Gerowitz and Kenneth Patrick Zabrycki. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Benjamin Edward Floering's contributions to the field of integrated circuits, particularly through his patent on scan chain connectivity, highlight his role as an influential inventor. His work continues to impact the efficiency of testing in electronic systems, showcasing the importance of innovation in technology.