Halmstad, Sweden

Bengt-Göran Rosen

This inventor holds 1 USPTO granted patent. Top assignee: Telefonaktiebolaget Lm Ericsson (Publ). Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bengt-Göran Rosen. Retrieved from https://idiyas.com/inventor/bengt-gandoumlran-rosen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Bengt-Göran Rosen: Innovator in Surface Texture Measurement

Introduction

Bengt-Göran Rosen is a notable inventor based in Halmstad, Sweden. He has made significant contributions to the field of surface texture measurement. His innovative approach has led to the development of a unique method that enhances the accuracy of surface texture determination.

Latest Patents

Rosen holds a patent for a "Method for determination of surface texture." This method involves a specified quantification of a maximal height of profile parameter (Rz) and a profile mean wavelength parameter (RSm). His work in this area has provided valuable insights into surface analysis.

Career Highlights

Bengt-Göran Rosen is associated with Telefonaktiebolaget LM Ericsson (Publ), a leading telecommunications company. His role at Ericsson has allowed him to apply his expertise in surface texture measurement to various projects, contributing to advancements in technology.

Collaborations

Throughout his career, Rosen has collaborated with talented individuals such as Fredrik Palmquist and Matti Siivola. These partnerships have fostered innovation and have been instrumental in the development of new technologies.

Conclusion

Bengt-Göran Rosen's contributions to surface texture measurement exemplify the impact of innovative thinking in technology. His patent and work at Ericsson highlight the importance of precision in engineering and manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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