Company Filing History:
Years Active: 2004-2009
Title: The Innovations of Ben Ohler
Introduction
Ben Ohler is a notable inventor based in Santa Barbara, CA. He has made significant contributions to the field of optical detection and force measurement technologies. With a total of 5 patents to his name, Ohler continues to push the boundaries of innovation in his industry.
Latest Patents
One of his latest patents is an "Optical detection alignment/tracking method and apparatus." This invention involves a method of operating a probe-based instrument that utilizes a light source to generate and direct a beam of light towards a probe. The method is designed to detect properties of probe deflection and automatically adjusts the position of the light beam based on the movement of the probe. This innovation aims to eliminate apparent parasitic deflection of the probe, enhancing measurement accuracy.
Another significant patent is the "Method of making a force curve measurement on a sample." This invention features a force scanning probe microscope (FSPM) that includes a piezoelectric scanner. The scanner supports the sample and allows movement in three orthogonal directions. The FSPM is equipped with a displacement sensor that measures the sample's movement and generates a corresponding position signal for closed-loop feedback. This technology is crucial for precise force measurements during data acquisition.
Career Highlights
Ben Ohler is currently employed at Veeco Instruments Inc., where he applies his expertise in developing advanced measurement technologies. His work has been instrumental in enhancing the capabilities of instruments used in various scientific and industrial applications.
Collaborations
Throughout his career, Ohler has collaborated with talented individuals such as Doug Gotthard and Jens Struckmeier. These partnerships have contributed to the successful development of innovative technologies and solutions in the field.
Conclusion
Ben Ohler's contributions to optical detection and force measurement technologies exemplify his commitment to innovation. His patents reflect a deep understanding of complex scientific principles and a dedication to advancing measurement techniques.