This inventor holds 2 USPTO granted patents. Top assignees: Inventec (Pudong) Technology Corporation, Inventec Corp.. Active years: 2022-2024.
Company Filing History:
2 out of 674 
2 out of 1,630 
Years Active: 2022-2024
Title: Ben Han - Innovator in Boundary Scan Testing
Introduction
Ben Han is a notable inventor based in Shanghai, China. He has made significant contributions to the field of boundary scan testing, with a focus on improving test efficiency and coverage. His innovative approaches have led to the development of two patents that enhance the testing processes for electronic components.
Latest Patents
Ben Han holds two patents that showcase his expertise in boundary scan testing. The first patent is titled "System of performing boundary scan test on pin through test point and method thereof." This invention provides a method for testing under-test pins of target connectors that are unable to perform boundary scan tests. By searching for the closest test point and comparing expected results with actual results, this system improves test efficiency and reduces costs compared to conventional methods.
The second patent is "Test coverage rate improvement system for pins of tested circuit board and method thereof." This invention addresses the challenge of testing partial pins of circuit board connectors that are not electrically connected to the boundary scan chip. By utilizing a test access port controller and a test pin board, this system enhances the test coverage rate for the pins of tested circuit boards.
Career Highlights
Throughout his career, Ben Han has worked with prominent companies in the technology sector. He has been associated with Inventec Corporation and Inventec (Pudong) Technology Corporation, where he has contributed to various projects and innovations in electronic testing.
Collaborations
Ben has collaborated with talented individuals such as Qiu-Yue Duan and Xin-Ying Xie. Their teamwork has fostered an environment of innovation and has led to advancements in boundary scan testing technologies.
Conclusion
Ben Han is a distinguished inventor whose work in boundary scan testing has significantly impacted the electronics industry. His patents reflect his commitment to improving testing methodologies and enhancing efficiency. His contributions continue to influence the field and pave the way for future innovations.