Edmonton, Canada

Ben Eccelstone

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Illumisonics Inc.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ben Eccelstone. Retrieved from https://idiyas.com/inventor/ben-eccelstone

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Ben Eccelstone: Innovator in Imaging Technology

Introduction

Ben Eccelstone is a notable inventor based in Edmonton, Canada. He has made significant contributions to the field of imaging technology, particularly through his innovative patent in remote sensing.

Latest Patents

Eccelstone holds a patent for a dual-modality photoacoustic remote sensing combined with optical coherence tomography (PARS-OCT) system. This advanced system is designed for visualizing intricate details in a sample. The system comprises one or more light sources configured to generate excitation beams, interrogation beams, a sample beam, and a reference beam, all aimed at enhancing the visualization capabilities below the surface of the sample. He has 1 patent to his name.

Career Highlights

Ben Eccelstone is associated with Illumisonics Inc., where he applies his expertise in imaging technology. His work has positioned him as a key player in the development of innovative imaging solutions.

Collaborations

Eccelstone collaborates with talented individuals such as Parsin Haji Reza and Zohreh Hosseinaee, contributing to the advancement of their shared goals in imaging technology.

Conclusion

Ben Eccelstone's contributions to imaging technology through his innovative patent demonstrate his commitment to advancing the field. His work continues to influence the way we visualize and understand complex samples.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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