Sunnyvale, CA, United States of America

Ben De Waal

This inventor holds 1 USPTO granted patent. Top assignee: Netapp, Inc.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ben De Waal. Retrieved from https://idiyas.com/inventor/ben-de-waal

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: The Innovations of Ben De Waal

Introduction

Ben De Waal is an accomplished inventor based in Sunnyvale, CA. He has made significant contributions to the field of virtual disk technology. His innovative approach has led to the development of a unique patent that enhances virtual disk conversion processes.

Latest Patents

Ben De Waal holds a patent for "Using an intermediate virtual disk format for virtual disk conversion." This patent describes a virtual disk conversion system that determines location ranges for data on a storage device. The system generates an intermediate virtual disk data structure containing these location ranges. This structure is then used to associate data at the location ranges with a new file representing a virtual disk in a destination format. He has 1 patent to his name.

Career Highlights

Ben is currently employed at NetApp, Inc., where he continues to work on innovative solutions in data storage and management. His expertise in virtual disk technology has positioned him as a valuable asset to his team and the company.

Collaborations

Some of his notable coworkers include Sunny Ratra and Sungwook Ryu, who collaborate with him on various projects within the company.

Conclusion

Ben De Waal's contributions to virtual disk technology exemplify the spirit of innovation in the tech industry. His work continues to influence advancements in data storage solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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