Mougins, France

Beatrice Brochier

This inventor holds 1 USPTO granted patent. Top assignee: Koninklijke Philips Corporation N.v.. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Beatrice Brochier. Retrieved from https://idiyas.com/inventor/beatrice-brochier-io6jmmg1

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Beatrice Brochier: Innovator in Integrated Circuit Testing

Introduction

Beatrice Brochier is a notable inventor based in Mougins, France. She has made significant contributions to the field of integrated circuit testing. Her innovative approach has led to the development of a unique method that enhances the reliability of electronic devices.

Latest Patents

Beatrice holds a patent for a "Method of testing an integrated circuit having a flexible timing control." This patent showcases her expertise in improving the functionality and efficiency of integrated circuits. She has been recognized for her innovative solutions in this technical domain.

Career Highlights

Beatrice is currently employed at Koninklijke Philips Corporation N.V., a leading company in the electronics industry. Her work at Philips has allowed her to apply her inventive skills in a practical setting, contributing to the advancement of technology.

Collaborations

Throughout her career, Beatrice has collaborated with talented professionals, including Olivier Giaume and Christelle Faucon. These collaborations have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Beatrice Brochier is a pioneering inventor whose work in integrated circuit testing has made a significant impact in the field. Her contributions continue to influence the development of reliable electronic devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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