Eindhoven, Netherlands

Bart Willem Jan Van Baarle

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Teledyne Dalsa B.v.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bart Willem Jan Van Baarle. Retrieved from https://idiyas.com/inventor/bart-willem-jan-van-baarle

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Bart Willem Jan Van Baarle: Innovator in Photon Detection Technology

Introduction

Bart Willem Jan Van Baarle is a notable inventor based in Eindhoven, Netherlands. He has made significant contributions to the field of photon detection technology. His innovative work has led to the development of a unique energy-resolving photon counting detector pixel.

Latest Patents

Bart Willem Jan Van Baarle holds a patent for an energy-resolving photon counting detector pixel. This technology includes a plurality of such pixels, which are operable in a calibration mode. In this mode, an offset unit determines a correction signal to be provided to the detecting unit and/or to the comparing unit. This correction is essential for addressing any offset in the detecting unit and/or comparing unit.

Career Highlights

Bart is currently employed at Teledyne Dalsa B.V., where he continues to advance his research and development efforts. His work at Teledyne Dalsa B.V. focuses on enhancing the capabilities of photon detection systems.

Collaborations

Bart Willem Jan Van Baarle collaborates with his coworker, Willem Johannes Kindt, to further innovate in the field of photon detection technology.

Conclusion

Bart Willem Jan Van Baarle is a prominent inventor whose work in energy-resolving photon counting detector technology has the potential to impact various applications in the field. His contributions continue to shape advancements in photon detection systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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