Barrett L Connolly

Title: Barrett L Connolly: Innovator in Integrated Circuit Measurement

Introduction

Barrett L Connolly is a notable inventor based in Lake Elmo, MN (US). He has made significant contributions to the field of integrated circuits, particularly in voltage measurement techniques. His innovative approach has led to the development of a unique patent that enhances the accuracy of voltage measurements in integrated circuits.

Latest Patents

Barrett holds a patent for an "Apparatus and method for performing a four-point voltage measurement for an integrated circuit." This invention provides a method and apparatus for determining a voltage, such as a bias voltage, supplied by an integrated circuit. A nominal terminating resistor is connected across a first and a second input/output pad from which the voltage is supplied. The voltage is measured across third and fourth pads connected, respectively, to the first and second pads. In an alternative embodiment, the functionality of the third and fourth pads is multiplexed between chip operational circuitry unrelated to the voltage to be measured and a connection to the first and second pads for measuring the voltage.

Career Highlights

Barrett is currently associated with Agere Systems Inc., where he continues to apply his expertise in integrated circuit technology. His work has been instrumental in advancing the capabilities of electronic devices through improved measurement techniques.

Collaborations

Barrett has collaborated with notable colleagues, including Neil Petrie and David Fitzgerald. Their combined efforts have contributed to the development of innovative solutions in the field of integrated circuits.

Conclusion

Barrett L Connolly's contributions to integrated circuit measurement demonstrate his commitment to innovation and excellence in technology. His patent reflects a significant advancement in the field, showcasing his expertise and dedication to improving electronic measurement techniques.