Luebeck, Germany

Bärbel Kratz

This inventor holds 1 USPTO granted patent and 1 published patent application and 3 EPO patents. Top assignee: Nikon Slm Solutions Ag. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bärbel Kratz. Retrieved from https://idiyas.com/inventor/barbel-kratz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Bärbel Kratz - Innovator in Three-Dimensional Workpiece Production

Introduction

Bärbel Kratz is an inventor based in Lübeck, Germany. He has made significant contributions to the field of additive manufacturing, particularly in the production of three-dimensional workpieces. Although he currently holds no granted patents, his work and patent applications reflect his innovative spirit and technical expertise.

Latest Patent Applications

Bärbel Kratz's notable patent application is titled "Device and Method for Producing a Three-Dimensional Workpiece." This application describes a process chamber, an apparatus, a modular system, a method, a safety device, a positioning system, and a system for producing a three-dimensional workpiece. The process chamber is designed for producing the three-dimensional workpiece via an additive layer construction method. It includes a material supply unit with a substantially ring-like shaped end portion at one side of the process chamber, which is adapted to supply material to a carrier for processing. The design aims to enhance the efficiency and effectiveness of three-dimensional production.

Conclusion

Bärbel Kratz is a dedicated inventor whose work in three-dimensional manufacturing showcases his innovative approach to technology. His contributions, particularly through his patent application, highlight the potential advancements in the field of additive manufacturing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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