Shandong, China

Bao Wen You

This inventor holds 1 USPTO granted patent. Top assignees: Hyundai Motor Company, Kia Corporation. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bao Wen You. Retrieved from https://idiyas.com/inventor/bao-wen-you

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Bao Wen You

Introduction

Bao Wen You is a notable inventor based in Shandong, China. He has made significant contributions to the field of vehicle control systems. His innovative approach has led to the development of a unique patent that enhances vehicle safety and performance.

Latest Patents

Bao Wen You holds a patent for a "System and method of controlling vehicle." This system includes a sensor and a controller designed to monitor vehicle operation state information. The sensor detects whether the vehicle is operating on a dangerous road and assesses the potential for driving system failures. The controller then makes decisions regarding torque control to ensure safe vehicle operation.

Career Highlights

Throughout his career, Bao Wen You has worked with prominent automotive companies, including Hyundai Motor Company and Kia Corporation. His experience in these organizations has allowed him to refine his skills and contribute to advancements in vehicle technology.

Collaborations

Bao Wen You has collaborated with talented professionals in the industry, including Sun Woo Park and Young Joon Chang. These partnerships have fostered innovation and have been instrumental in the development of his patented technology.

Conclusion

Bao Wen You's contributions to vehicle control systems exemplify his innovative spirit and dedication to enhancing automotive safety. His work continues to influence the industry and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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