Balaji Upputuri

Title: The Innovative Contributions of Balaji Upputuri

Introduction

Balaji Upputuri is a notable inventor based in Ongole, India. He has made significant contributions to the field of integrated circuit testing, holding a total of four patents. His work focuses on enhancing the efficiency and effectiveness of testing methods for integrated circuits.

Latest Patents

Among his latest patents is a method and apparatus for capture clock control to minimize toggling during testing. This innovative method involves detecting integrated clock gates (ICGs) within an integrated circuit device. By comparing the ICG fanout with a threshold number of registers, Balaji's method determines whether the function-enable path of an existing ICG is timing-critical. If it is, an additional ICG and a test point are inserted to optimize clock input. If not, a test point and an AND-gate may be added to the function-enable path. Another significant patent is related to power-sensitive scan-chain testing. This method addresses the challenges of scan-chain testing in integrated circuits with resource constraints. It involves propagating scan-chain data patterns while gating designated paths to manage power consumption and data congestion effectively.

Career Highlights

Balaji Upputuri is currently employed at Marvell Asia Pte., Ltd., where he continues to innovate in the field of integrated circuits. His expertise in testing methodologies has positioned him as a valuable asset to his company and the industry at large.

Collaborations

Throughout his career, Balaji has collaborated with talented individuals such as Sreekanth G Pai and Scott Mack. These collaborations have further enriched his work and contributed to the development of advanced testing techniques.

Conclusion

Balaji Upputuri's contributions to integrated circuit testing through his innovative patents demonstrate his commitment to advancing technology. His work not only enhances testing methodologies but also sets a standard for future innovations in the field.