The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2024
Filed:
Jan. 25, 2023
Marvell Asia Pte Ltd, Singapore, SG;
Marvell Asia Pte Ltd, Singapore, SG;
Abstract
A method of scan-chain testing of an integrated circuit device having a plurality of respective scan-chain paths, at least some of the respective scan-chain paths being designated as having resource constraints, includes propagating a respective scan-chain data pattern through each of the respective scan-chain paths, and gating each respective scan-chain path designated as having resource constraints, to reduce a rate of scan-chain data propagation through the respective scan-chain path, without gating any scan-chain path not designated as having resource constraints. Scan-chain paths may be designated as having resource constraints because of high power consumption or data congestion.