Beijing, China

Baichuan Nie


Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: **Baichuan Nie: Innovator in Security Configuration Verification**

Introduction

Baichuan Nie is an accomplished inventor based in Beijing, China, known for his contributions to network security technologies. With a focus on innovations aimed at improving security configurations, Nie has made significant strides in the field, exemplified by his notable patent.

Latest Patents

Baichuan Nie holds a patent titled "Security configuration verification device and method and network system employing the same." This invention details a device designed for performing security configuration verification on network devices. It incorporates various components, including one or more preconfigured scanning policies, a scanning policy generator that selects a policy to create a new corresponding scanning policy, and a scanner that executes security scans using this generated policy. This innovative approach enhances the effectiveness of network security auditing processes.

Career Highlights

Baichuan Nie is notably affiliated with Nsfocus Information Technology Co., Ltd., a company specializing in cybersecurity solutions. His work there underscores his commitment to advancing network security through innovative methodologies and technologies.

Collaborations

Throughout his career, Nie has collaborated with esteemed colleagues, including Jianpeng Sun and Jian Ding. These partnerships have likely contributed to the refinement of his ideas and the successful execution of impactful projects within the cybersecurity domain.

Conclusion

Baichuan Nie stands out as a dedicated inventor whose work is paving the way for improved security configurations in network devices. His patent reflects a deep understanding of security needs in the digital age, and his role at Nsfocus Information Technology Co., Ltd. places him at the forefront of technological advancements in this critical field.

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