Kirkland, WA, United States of America

Ba Kang Chu

This inventor holds 1 USPTO granted patent. Top assignee: Cypress Semiconductor Corporation. Active years: 2010.


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Ba Kang Chu - Innovator in Non-Volatile Memory Verification

Introduction

Ba Kang Chu is an accomplished inventor based in Kirkland, WA (US). He has made significant contributions to the field of non-volatile memory technology. His innovative approach has led to the development of a unique method for verifying data integrity in memory systems.

Latest Patents

Ba Kang Chu holds a patent for a method and apparatus for verifying non-volatile memory. The patent, titled "Self verification of non-volatile memory," describes a process where a first transmission of data is received by a first memory of a device. The data is then stored in a non-volatile memory, where it is verified by comparing it to the data in the first memory using the device's comparison logic. This verification process is notable for being conducted without the need for a second transmission of the data, thus streamlining the verification process. The result of this comparison generates a reliable outcome regarding the integrity of the stored data.

Career Highlights

Ba Kang Chu is currently employed at Cypress Semiconductor Corporation, where he continues to work on advancing memory technologies. His expertise in non-volatile memory systems has positioned him as a valuable asset to the company.

Collaborations

Some of his notable coworkers include Mark W Rouse and Xuan Nguyen, who contribute to the innovative environment at Cypress Semiconductor Corporation.

Conclusion

Ba Kang Chu's work in the field of non-volatile memory verification exemplifies the impact of innovative thinking in technology. His patent reflects a significant advancement in ensuring data integrity, showcasing his role as a key inventor in this domain.

Profile summary based on public USPTO records.
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