Böblingen, Germany

Axel Von Wallfeld

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Axel Von Wallfeld. Retrieved from https://idiyas.com/inventor/axel-von-wallfeld

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:

goldMedal1 out of 834,601 
Other
 patents

Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: Axel Von Wallfeld: Innovator in Spatial Coordinate Determination

Introduction

Axel Von Wallfeld is a notable inventor based in Böblingen, Germany. He has made significant contributions to the field of spatial coordinate determination. His innovative approach has led to the development of a unique method that enhances accuracy in determining absolute spatial coordinates.

Latest Patents

Axel holds a patent for a "Method for determining absolute spatial coordinates of at least one." This patent showcases his expertise and commitment to advancing technology in this area. He has successfully secured 1 patent that reflects his innovative capabilities.

Career Highlights

Throughout his career, Axel has demonstrated a strong dedication to research and development. His work has been instrumental in pushing the boundaries of what is possible in spatial technology. He continues to explore new ideas and methodologies that can further enhance the field.

Collaborations

Axel has collaborated with talented individuals such as Michael Matallana Kielmann and Klaus Thomas Bende. These partnerships have allowed him to share knowledge and expertise, fostering an environment of innovation and creativity.

Conclusion

Axel Von Wallfeld is a distinguished inventor whose work in spatial coordinate determination has made a lasting impact. His innovative methods and collaborations highlight his commitment to advancing technology in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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