Delhi, India

Avneet Kaur Nanda

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Avneet Kaur Nanda. Retrieved from https://idiyas.com/inventor/avneet-kaur-nanda

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Avneet Kaur Nanda: Inventor in Microservice Reliability.

Introduction

Avneet Kaur Nanda is an inventor based in Delhi, India. Her patent work addresses how software systems can capture useful diagnostic information when microservices are at risk of failure.

Latest Patents

Nanda is associated with 1 patent, titled “Intelligent Logging of Microservice Failures.” The invention predicts when a microservice in a chain may fail, identifies a likely failure type, and determines a detailed logging level that can capture information needed to investigate the root cause. During the predicted high-risk period, the microservice is directed to increase its logging level, helping preserve relevant diagnostic details while it performs an application transaction.

Career Highlights

Nanda is associated with International Business Machines Corporation (IBM). Her patent reflects work on improving the observability and troubleshooting of microservice-based applications.

Collaborations

Her listed coworkers include Madhavi Rani and Pravin Kailashnath Kedia. Their shared association with the patent record highlights collaborative contributions to software reliability and failure diagnosis.

Conclusion

Avneet Kaur Nanda’s patent focuses on anticipating microservice failures and capturing the information needed to diagnose them, contributing to more effective troubleshooting of distributed applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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