Givatayim, Israel

Aviv David Eldan

This inventor holds 1 USPTO granted patent. Top assignee: Microsoft Technology Licensing, LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Aviv David Eldan. Retrieved from https://idiyas.com/inventor/aviv-david-eldan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Aviv David Eldan: Cloud Security and Deployment Risk Prevention.

Introduction

Aviv David Eldan is an inventor based in Givatayim, Israel. His patent work focuses on identifying security risks associated with infrastructure changes in cloud computing environments before those changes reach production.

Latest Patents

Eldan is associated with 1 patent, titled “Proactively Determining Security Risks and Deployment Impacts Across Cloud Computing Environments.” The invention describes a system that evaluates candidate code-based infrastructure changes using runtime resource information. It aims to identify new security risks, attack patterns, and vulnerabilities before deployment. The system can block changes that may negatively affect security, report potential breaches, or automatically modify candidate changes to address vulnerabilities.

Career Highlights

Eldan is associated with Microsoft Technology Licensing, LLC. His patent reflects an approach to proactive cloud security that assesses the potential impact of infrastructure changes before they are deployed in a production environment.

Collaborations

Eldan’s listed coworker is Asaf Nakash. Their association provides context for the professional connections related to this patent.

Conclusion

Aviv David Eldan’s patent work addresses a key cloud computing challenge by helping organizations detect and mitigate security risks before infrastructure changes enter production.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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