Nishikamo-gun, Japan

Atsuto Okamoto

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Mec International Co., Ltd., Toyota Jidosha Kabushiki Kaisha. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Atsuto Okamoto. Retrieved from https://idiyas.com/inventor/atsuto-okamoto-4mmqdocu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Atsuto Okamoto: Innovator in Die-Casting Technology

Introduction

Atsuto Okamoto is a notable inventor hailing from Nishikamo-gun, Japan. He has made significant contributions to the field of die-casting technology, particularly with his innovative designs and methods.

Latest Patents

Okamoto holds a patent for a die-casting die and method for die-casting. This invention features a die-casting die that includes a cavity forming surface. A part of this cavity forming surface is coated with a surface treatment layer. The surface treatment layer consists of a mixture of fibrous carbon and particle carbon, which enhances thermal conductivity in relation to the pressure applied.

Career Highlights

Throughout his career, Atsuto Okamoto has worked with prominent companies, including Toyota Motor Corporation and Mec International Co., Ltd. His experience in these organizations has allowed him to refine his skills and contribute to advancements in die-casting technology.

Collaborations

Okamoto has collaborated with notable coworkers such as Yuichi Furukawa and Fumio Kawahara. Their combined expertise has fostered innovation in their respective fields.

Conclusion

Atsuto Okamoto's contributions to die-casting technology exemplify his innovative spirit and dedication to advancing manufacturing processes. His work continues to influence the industry and inspire future inventors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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