Gifu, Japan

Atsumasa Doi

This inventor holds 2 USPTO granted patents. Top assignee: Other. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Atsumasa Doi. Retrieved from https://idiyas.com/inventor/atsumasa-doi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 4.8

ph-index = 2

Forward Citations = 67(Granted Patents)


Location History:

  • Gifu, JP (2004)
  • Ogaki, JP (2004)

Company Filing History:

goldMedal2 out of 834,453 
Other
 patents

Years Active: 2004

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2 patents (USPTO):Explore Patents

Title: Atsumasa Doi: Innovator in Gas Cluster Technology

Introduction

Atsumasa Doi is a notable inventor based in Gifu, Japan. He has made significant contributions to the field of gas cluster technology, holding a total of 2 patents. His work focuses on innovative methods for forming gas clusters and thin films, which have important applications in various industries.

Latest Patents

Doi's latest patents include a "Method for forming gas cluster" and a "Method for forming thin film with a gas cluster ion beam." These inventions showcase his expertise in utilizing gas clusters for advanced material processing techniques.

Career Highlights

Throughout his career, Atsumasa Doi has demonstrated a commitment to innovation and research. His patents reflect a deep understanding of the complexities involved in gas cluster technology and its applications in thin film formation.

Collaborations

Doi has collaborated with notable colleagues such as Makoto Akizuki and Mitsuaki Harada. These partnerships have likely contributed to the advancement of his research and the successful development of his patented technologies.

Conclusion

Atsumasa Doi is a distinguished inventor whose work in gas cluster technology has led to valuable patents and advancements in material science. His contributions continue to influence the field and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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