Hiratsuka, Japan

Atsuhiko Hirosawa

This inventor holds 2 USPTO granted patents and 1 published patent application and 1 EPO patent. Top assignee: Kabushiki Kaisha Komatsu Seisakusho. Active years: 1995-1997.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Atsuhiko Hirosawa. Retrieved from https://idiyas.com/inventor/atsuhiko-hirosawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 100.0

 

Average Co-Inventor Count = 4.0

ph-index = 2

Forward Citations = 55(Granted Patents)


Company Filing History:


Years Active: 1995-1997

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2 patents (USPTO):Explore Patents

Title: Atsuhiko Hirosawa: Innovator in Metal Detection Technology

Introduction

Atsuhiko Hirosawa is a notable inventor based in Hiratsuka, Japan. He has made significant contributions to the field of metal detection technology, holding a total of 2 patents. His work has been instrumental in advancing methods and devices that enhance the detection of metal particles.

Latest Patents

Hirosawa's latest patents include a metal particle detecting sensor and a metal particle detecting method. Additionally, he has developed an electrode structure for metallic particle detecting sensors. These innovations reflect his commitment to improving detection technologies.

Career Highlights

Throughout his career, Hirosawa has worked with prominent companies such as Komatsu Ltd. and Shell International Research. His experience in these organizations has allowed him to refine his skills and contribute to significant advancements in his field.

Collaborations

Hirosawa has collaborated with esteemed colleagues, including Akira Mori and Ikuo Uchino. Their joint efforts have further propelled the development of innovative technologies in metal detection.

Conclusion

Atsuhiko Hirosawa's contributions to metal detection technology through his patents and collaborations highlight his role as a key innovator in this field. His work continues to influence advancements in detection methods and devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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