Ludwigshafen, Germany

Astrid Elisa Niederle

This inventor holds 1 USPTO granted patent and 2 published patent applications and 1 EPO patent. Top assignee: Basf Se Corporation. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Astrid Elisa Niederle. Retrieved from https://idiyas.com/inventor/astrid-elisa-niederle

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 9.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Astrid Elisa Niederle: Innovator in Data Extraction Systems

Introduction

Astrid Elisa Niederle is a prominent inventor based in Ludwigshafen, Germany. She has made significant contributions to the field of data extraction technology. Her innovative approach has led to the development of a unique system that enhances the efficiency of data handling.

Latest Patents

Astrid holds a patent for a data extraction system. This system is designed for extracting data from one or more tabular data files. It includes a user interface that facilitates users in submitting tabular data files, each containing at least one table. This invention showcases her ability to address complex data management challenges.

Career Highlights

Astrid is currently employed at BASF SE Corporation, where she applies her expertise in data systems. Her work at this leading chemical company allows her to collaborate with other talented professionals in the field.

Collaborations

Some of her notable coworkers include Mara Nikola Jochum and Kevin Kiefer. Their collaborative efforts contribute to the innovative environment at BASF SE Corporation.

Conclusion

Astrid Elisa Niederle is a remarkable inventor whose work in data extraction systems exemplifies her commitment to innovation. Her contributions are paving the way for advancements in data management technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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