Brookline, MA, United States of America

Assaf J Kfoury

This inventor holds 1 USPTO granted patent. Top assignee: Boston University. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Assaf J Kfoury. Retrieved from https://idiyas.com/inventor/assaf-j-kfoury

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Assaf J Kfoury: Innovator in Software Inspection Systems

Introduction

Assaf J Kfoury is a notable inventor based in Brookline, MA (US). He has made significant contributions to the field of software inspection, particularly in developing methods to analyze computer code for potential malware.

Latest Patents

Kfoury holds a patent for a software inspection system. This innovative method analyzes a body of computer code to assess whether it contains malware. The process involves extracting executable elements from the code and modifying them using specific rules related to the programming language and security specifications. The resulting model is then analyzed using a model checking system to identify any violations of language rules, flagging the code as potentially malicious.

Career Highlights

Assaf J Kfoury is affiliated with Boston University, where he continues to advance his research and development in software technologies. His work has implications for enhancing software security and protecting users from malware threats.

Collaborations

Kfoury has collaborated with esteemed colleagues such as Mark C Reynolds and Azer Bestavros, contributing to a rich environment of innovation and research.

Conclusion

Assaf J Kfoury's work in software inspection systems exemplifies the importance of innovation in cybersecurity. His contributions are vital in the ongoing battle against malware, ensuring safer software for users everywhere.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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