Minneapolis, MN, United States of America

Ashok Muralidhar


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Innovations of Ashok Muralidhar in Force Characterization Technology

Introduction

Ashok Muralidhar is an accomplished inventor based in Minneapolis, MN. He has made significant contributions to the field of force characterization technology, particularly through his innovative patent. His work is instrumental in enhancing the precision and functionality of coordinate measuring machines (CMM).

Latest Patents

Muralidhar holds a patent for a "Dual-axis static and dynamic force characterization device." This device utilizes a flexure that consists of a compliant portion and a solid portion. During the operation of a CMM on the solid portion of the flexure, a first capacitance probe detects displacement in one dimension, while a second capacitance probe detects displacement in a perpendicular dimension. The displacements are correlated to the forces applied to the flexure, allowing for accurate determination of total applied force. This innovation is particularly useful for touch-trigger and scanning operations of the CMM.

Career Highlights

Muralidhar's career is marked by his dedication to advancing measurement technologies. He has worked extensively in research and development, focusing on improving the accuracy and efficiency of measurement devices. His contributions have been recognized within the academic and industrial communities.

Collaborations

Muralidhar has collaborated with notable colleagues, including Paulo H Pereira and Robert J Hocken. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Ashok Muralidhar's work in force characterization technology exemplifies the impact of innovative thinking in engineering. His patent for the dual-axis force characterization device represents a significant advancement in the field, showcasing his commitment to enhancing measurement precision.

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