Sugar Land, TX, United States of America

Arvind Reddy Battula

This inventor holds 1 USPTO granted patent. Top assignee: Chevron U.s.a. Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Arvind Reddy Battula. Retrieved from https://idiyas.com/inventor/arvind-reddy-battula

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Arvind Reddy Battula and Predictive Analytics for Hydraulic Fracturing.

Introduction

Arvind Reddy Battula is an inventor based in Sugar Land, Texas. His patent work applies machine learning and predictive analytics to help anticipate fracture-driven interactions during hydrocarbon well operations.

Latest Patents

Battula is associated with 1 patent: “Method and System for Machine Learning and Predictive Analytics of Fracture Driven Interactions.” The invention describes a computing system that trains a machine-learning model using well-treatment pumping data, offset-well production data, and well-stage data. After extracting features from these sources, the model estimates the probability of a fracture-driven interaction. It can be deployed during ongoing hydraulic fracturing operations to support real-time prediction and help reduce such interactions.

Career Highlights

Battula is associated with Chevron U.S.A. Inc. His patent reflects the use of data-driven methods to address operational challenges in hydrocarbon well development.

Collaborations

Battula’s listed coworker is Brandon Francis Hruby. The patent’s described approach combines multiple types of well data to inform predictive modeling for hydraulic fracturing operations.

Conclusion

Arvind Reddy Battula’s patented work brings machine learning into hydraulic fracturing, with the goal of predicting fracture-driven interactions and supporting more informed operational decisions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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