Tamil, India

Arulvel Sellamuthu

This inventor holds 1 USPTO granted patent. Top assignee: Honeywell International Inc.. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Arulvel Sellamuthu. Retrieved from https://idiyas.com/inventor/arulvel-sellamuthu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Arulvel Sellamuthu: Innovator in LVDT Technology

Introduction

Arulvel Sellamuthu is a notable inventor based in Tamil, India. He has made significant contributions to the field of measurement technology, particularly through his innovative patent related to linear variable differential transformers (LVDT).

Latest Patents

Arulvel holds a patent titled "Method and apparatus for detection of LVDT core fallout condition." This invention involves a method that measures a first voltage across a first sensing coil of an LVDT and a second voltage across a second sensing coil. The method signals a core fallout condition based on specific voltage ratios and sums, ensuring accurate detection of LVDT performance. He has 1 patent to his name.

Career Highlights

Arulvel is currently employed at Honeywell International Inc., where he applies his expertise in measurement technologies. His work focuses on enhancing the reliability and accuracy of LVDT systems, contributing to advancements in various industrial applications.

Collaborations

Some of his coworkers include Rakesh Damodaran Nair and Nagaraja Sundaresh, who collaborate with him on various projects within the company.

Conclusion

Arulvel Sellamuthu's innovative work in LVDT technology exemplifies the impact of dedicated inventors in advancing measurement systems. His contributions continue to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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