Arthur J Levy

Title: Inventor Profile: Arthur J. Levy from Schenectady, NY

Introduction

Arthur J. Levy is a notable inventor based in Schenectady, New York, with a remarkable portfolio of five patents. His contributions to the field of non-destructive testing and signal processing have paved the way for innovative advancements in technology.

Latest Patents

Among his most recent patents, Levy has developed the "Automated Detection and Location of Indications in Eddy Current Signals." This invention introduces a computer-implemented information extraction process designed to enhance signal features relative to noise, facilitating the identification and localization of eddy current signal features derived from the inspection of test materials. The process significantly improves the efficiency of data interpretation by providing precise information about the identity and location of detected features.

Another notable patent is "Automated Feature Detection and Identification in Digital Point-Ordered Signals." This automated method processes digital point-ordered signals, particularly those arising from non-destructive tests such as eddy current signals from calibration standards. The solution includes features for noise reduction, baseline determination, and the application of mathematical morphology filters for feature detection. The verification of identified features is achieved through an expert system utilizing pattern recognition methods, ensuring that the procedure is fully automated and devoid of subjective operator intervention.

Career Highlights

Arthur J. Levy works with the United States of America and has made significant advancements in technology and innovation throughout his career. His expertise in signal processing and non-destructive testing has resulted in patents that address practical challenges in the industry.

Collaborations

Levy has collaborated with esteemed professionals in his endeavors, including David M. Brudnoy and Jane E. Oppenlander. Their partnership enriches the development of methodologies that streamline processes and enhance accuracy in signal processing applications.

Conclusion

Arthur J. Levy's innovative patents and collaborative efforts reflect his commitment to advancing technology in non-destructive testing. His work is critical in improving the accuracy and efficiency of inspections, thereby contributing significantly to the field and inspiring future inventors.