The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 1998
Filed:
Apr. 20, 1995
Jane E Oppenlander, Burnt Hills, NY (US);
Kent C Loomis, Clifton Park, NY (US);
David M Brudnoy, Albany, NY (US);
Arthur J Levy, Schenectady, NY (US);
Abstract
A computer-based automated method to detect and identify features in digital point-ordered signals. The method is used for processing of non-destructive test signals, such as eddy current signals obtained from calibration standards. The signals are first automatically processed to remove noise and to determine a baseline. Next, features are detected in the signals using mathematical morphology filters. Finally, verification of the features is made using an expert system of pattern recognition methods and geometric criteria. The method has the advantage that standard features can be, located without prior knowledge of the number or sequence of the features. Further advantages are that standard features can be differentiated from irrelevant signal features such as noise, and detected features are automatically verified by parameters extracted from the signals. The method proceeds fully automatically without initial operator set-up and without subjective operator feature judgement.