River Falls, WI, United States of America

Arthur H Orth

This inventor holds 1 USPTO granted patent. Top assignee: Cray Research, Inc.. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Arthur H Orth. Retrieved from https://idiyas.com/inventor/arthur-h-orth

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 14(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: Arthur H. Orth and Clock Pulse Measurement

Introduction

Arthur H. Orth is an inventor associated with River Falls, Wisconsin, and Cray Research, Inc. His patent work addresses the measurement and correction of clock-signal skew in electronic systems.

Latest Patents

Orth is credited with 1 patent: “Clock Pulse Measuring and Deskewing System and Process.” The invention determines circuit skew within a clock-pulse distribution network by forming a closed loop that includes the circuit under test. It counts pulses during a defined sampling period, using the result to measure skew and optimize the delay applied during normal operation. By measuring dynamically under typical machine conditions, the system can account for real-world operating environments.

Career Highlights

Orth’s patent connects his work with Cray Research, Inc., a company known for developing computing systems. The invention focuses on reliable clock-pulse distribution, an important consideration in coordinating circuit operations.

Collaborations

Orth’s listed coworkers include Kenneth A. Van Goor and Mark Ronald Sikkink. Their shared association provides context for the professional environment surrounding his work.

Conclusion

Arthur H. Orth’s patented clock-pulse measuring and deskewing system offers a dynamic approach to identifying circuit skew and adjusting signal delay.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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