This inventor holds 3 USPTO granted patents and 1 published patent application and 1 EPO patent. Top assignees: Bioscrypt, Inc., Artec Europe S.a.r.l.. Active years: 2012-2020.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Palo Alto, CA (US) (2012)
- Moscow, RU (2015 - 2020)
Company Filing History:
Years Active: 2012-2020
Title: Artem Leonidovich Yukhin: Innovator in 3D Measurement and Biometric Control
Introduction
Artem Leonidovich Yukhin is a notable inventor based in Moscow, Russia. He has made significant contributions to the fields of 3D measurement and biometric control, holding a total of 3 patents. His innovative approaches have paved the way for advancements in technology and measurement techniques.
Latest Patents
Yukhin's latest patents include a method for monitoring linear dimensions of three-dimensional objects. This method utilizes two cameras positioned at different distances from a projector to perform 3D measurements. It involves projecting a known pattern to create bands on an object's surface and capturing images to determine precise coordinates. Another significant patent is a device for biometrically controlling a face surface. This device integrates a camera, a face position display unit, and an illumination unit to enhance facial recognition accuracy.
Career Highlights
Throughout his career, Yukhin has worked with prominent companies such as Bioscrypt, Inc. and Artec Europe S.a.r.l. His experience in these organizations has contributed to his expertise in developing innovative technologies.
Collaborations
Yukhin has collaborated with notable professionals in his field, including Andrey Vladimirovich Klimov and Sergey Vladimirovich Suhovey. These collaborations have further enriched his work and expanded his impact on technology.
Conclusion
Artem Leonidovich Yukhin is a distinguished inventor whose work in 3D measurement and biometric control continues to influence technological advancements. His patents reflect a commitment to innovation and precision in measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile