Berg, Germany

Arnold Siegfried Dietrich


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 26(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: Arnold Siegfried Dietrich: Innovator in Electronic Memory Module Testing

Introduction

Arnold Siegfried Dietrich is a notable inventor based in Berg, Germany. He has made significant contributions to the field of electronic memory module testing. His innovative approach has led to the development of a unique connector alignment assembly that enhances the efficiency of memory module testing.

Latest Patents

Arnold Siegfried Dietrich holds a patent for a connector alignment assembly for an electronic memory module tester. This invention provides a solution for aligning memory modules in a test position relative to a memory module tester. The assembly includes an automatic feeder that stages and dispenses electronic memory modules onto a conveyor, ensuring a streamlined testing process. The contact plunger in the assembly pushes tester contacts against the surface contacts of the electronic memory module, establishing an electrical connection to the test circuitry. The design features two alignment pins that guide the electronic memory module into the correct position, facilitating accurate testing.

Career Highlights

Arnold Siegfried Dietrich is associated with Computer Service Technology, Inc., where he applies his expertise in electronic testing technologies. His work has been instrumental in advancing the capabilities of memory module testers, making them more efficient and reliable.

Collaborations

Arnold collaborates with Erwin Heinrich, a fellow innovator in the field. Their combined efforts contribute to the ongoing development of advanced testing solutions.

Conclusion

Arnold Siegfried Dietrich's contributions to electronic memory module testing exemplify the impact of innovation in technology. His patented connector alignment assembly represents a significant advancement in the field, enhancing the efficiency and accuracy of memory module testing processes.

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