North Chelmsford, MA, United States of America

Arnold Cheng


Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 26(Granted Patents)


Location History:

  • Chelmsford, MA (US) (2000)
  • North Chelmsford, MA (US) (2003)

Company Filing History:


Years Active: 2000-2003

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2 patents (USPTO):Explore Patents

Title: Arnold Cheng: Innovator in Semiconductor Technology

Introduction

Arnold Cheng is a notable inventor based in North Chelmsford, MA (US). He has made significant contributions to the field of semiconductor technology, holding 2 patents that showcase his innovative approach to data management and inspection systems.

Latest Patents

Cheng's latest patents include a "Method and system for reviewing a semiconductor wafer using at least one defect sampling condition." This invention involves a data management system that connects multiple inspection devices to a server, allowing for efficient scanning and defect detection on semiconductor wafers. The system enables the extraction of defect samples from a database, enhancing the review process.

Another significant patent is the "Method and system for establishing a common reference point on a semiconductor wafer inspected by two or more scanning mechanisms." This method establishes a common reference point on a semiconductor wafer by utilizing two scanning mechanisms to create coordinate systems, ensuring precise measurements and inspections.

Career Highlights

Arnold Cheng is currently employed at Inspex, Inc., where he continues to develop innovative solutions in semiconductor inspection technology. His work has been instrumental in advancing the efficiency and accuracy of semiconductor manufacturing processes.

Collaborations

Cheng collaborates with talented individuals such as Chin-Jung Hsu and James Ni, contributing to a dynamic team focused on pushing the boundaries of semiconductor technology.

Conclusion

Arnold Cheng's contributions to semiconductor technology through his patents and collaborative efforts highlight his role as an influential inventor in the field. His innovative methods continue to shape the future of semiconductor inspection and data management.

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