Haifa, Israel

Arnab Maity

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Technion Research & Development Foundation Ltd. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Arnab Maity. Retrieved from https://idiyas.com/inventor/arnab-maity-9zna0590

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Arnab Maity: Inventor in Chemical Analysis

Introduction

Arnab Maity is an inventor based in Haifa, Israel. His work includes a patented method and system for detecting and analyzing chemical compounds in samples separated by chromatography on a layered medium. He is associated with Technion Research & Development Foundation Ltd.

Latest Patents

Maity is named on 1 patent: “Method and system for detection and analysis of chemical compounds in a sample subjected to a chromatographic separation on a layered separating medium.”

The invention uses an array of sensors printed on the layers of a separating medium to detect compounds and provide information about their properties. It also applies machine-learning methods to analyze spectrometry data, including micro gas chromatography data. These methods can account for kinetic and thermodynamic parameters and support applications such as real-time molecular analysis.

Career Highlights

Maity’s patent describes an approach that combines layered chromatographic separation, sensor arrays, and machine learning. The proposed system is intended to offer an alternative to traditional spectroscopic and chromatographic analytical methods.

Collaborations

Maity’s listed coworker is Hossam Haick. The patent information provided describes their connection but does not specify the nature of their collaboration.

Conclusion

Arnab Maity’s patented work brings together sensor technology and machine learning to advance the detection and analysis of chemical compounds.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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