Ludhiana, India

Armit P Singh

This inventor holds 1 USPTO granted patent. Top assignee: Freescale Semiconductor,inc.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Armit P Singh. Retrieved from https://idiyas.com/inventor/armit-p-singh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Armit P Singh: Inventor in Wireless Communications.

Introduction

Armit P Singh is an inventor associated with Ludhiana, India. His patent work addresses symbol boundary detection in orthogonal frequency-division multiplexing (OFDM) data communication.

Latest Patents

The provided information lists one patent for Singh: “System and Method for Symbol Boundary Detection in Orthogonal Frequency Division Multiplexing Based Data Communication.” The invention describes a method for estimating the boundary of a data packet containing a first training field, a guard interval, and a second training field. It uses sampled signal data to calculate an initial boundary estimate from block auto-correlation values, then refines that estimate using cross-correlation values and moving-average auto-correlation values from nearby samples.

1 patent

Career Highlights

Singh is associated with Freescale Semiconductor, Inc. The available information connects his work there with wireless communication technology and OFDM signal processing.

Collaborations

The provided information names Anshoo Tandon and Mridul Manohar Mishra as Singh’s coworkers. It does not specify their roles in the patent or whether they collaborated directly on the invention.

Conclusion

Armit P Singh’s listed patent focuses on improving the accuracy of OFDM symbol boundary detection through a sequence of correlation-based estimates and refinements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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