Munich, Germany

Armin Schneider

This inventor holds 1 USPTO granted patent. Top assignee: Siemens Aktiengesellschaft. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Armin Schneider. Retrieved from https://idiyas.com/inventor/armin-schneider-7wt0zoy8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Armin Schneider and Medical Imaging Innovation.

Introduction

Armin Schneider is an inventor associated with Munich, Germany, and Siemens Aktiengesellschaft. His patent describes a method for automatically marking objects in medical images.

Latest Patents

Schneider’s listed patent, “Method for Automatic Object Marking in Medical Imaging,” presents a workflow for identifying and highlighting an object in image data. Different display modes of an image data record are shown in separate windows. A user selects an initial point on the object, and the computer applies pattern-recognition techniques around that point to create a detailed, high-resolution marking. The marking is reversibly coded in the image data, and the object is then visually accentuated against its surroundings. Schneider is credited with 1 patent.

Career Highlights

The available information associates Schneider’s work with Siemens Aktiengesellschaft and focuses on applying pattern recognition to medical imaging. The patent’s approach combines user input with automated image analysis to support object marking.

Collaborations

Helmut Barfuss and Karl Barth are identified as Schneider’s coworkers. The provided information does not specify their roles in the patent.

Conclusion

Armin Schneider’s listed invention combines interactive selection and automated pattern recognition to mark objects in medical images.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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