Huettenberg, Germany

Armin Konrad

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Hexagon Metrology Gmbh. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Armin Konrad. Retrieved from https://idiyas.com/inventor/armin-konrad-82e9xksr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Armin Konrad: Innovator in Coordinate Measuring Technology

Introduction

Armin Konrad is a notable inventor based in Hüttenberg, Germany. He has made significant contributions to the field of coordinate measuring technology. His innovative work has led to the development of a unique coordinate measuring apparatus.

Latest Patents

Armin Konrad holds a patent for a coordinate measuring machine that features a ram. This invention enhances the precision and efficiency of measurements in various applications. His patent is a testament to his expertise and dedication to advancing measurement technology.

Career Highlights

Armin Konrad is associated with Hexagon Metrology GmbH, a company renowned for its cutting-edge measurement solutions. His role at the company has allowed him to contribute to significant advancements in the field. With a focus on innovation, he continues to push the boundaries of what is possible in coordinate measurement.

Collaborations

Armin has collaborated with talented individuals such as Claude Rouge and Léonard Wunderlin. These partnerships have fostered a creative environment that encourages the exchange of ideas and expertise.

Conclusion

Armin Konrad's contributions to coordinate measuring technology exemplify his commitment to innovation. His work not only enhances measurement accuracy but also sets a standard for future developments in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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