Dettingen, Germany

Armin Keinath



Average Co-Inventor Count = 2.3

ph-index = 3

Forward Citations = 20(Granted Patents)


Company Filing History:


Years Active: 1997-2002

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4 patents (USPTO):Explore Patents

Title: Armin Keinath: Innovator in Optoelectronic Technology

Introduction

Armin Keinath is a notable inventor based in Dettingen, Germany. He has made significant contributions to the field of optoelectronics, holding a total of four patents. His work focuses on developing advanced technologies that enhance the measurement and profiling of objects.

Latest Patents

One of Armin Keinath's latest patents is an optoelectronic arrangement for determining an object's profile. This innovative rangefinder apparatus utilizes a transmitter that emits light rays, which are then deflected by a unit to measure the height profile of an object. The apparatus includes a receiver that captures the light rays reflected from the object. The deflection unit features a transmitting optic and an actuator that periodically deflects the transmitted light. Additionally, a receiving optic is positioned to ensure that the beam axes of the transmitted and received light rays are distinct from one another. An evaluation unit processes the reflected light rays and associated deflection angles to determine the object's height profile.

Career Highlights

Armin Keinath has worked with Leuze Electronic GmbH + Co. and Leuze Electronic GmbH & Co., where he has contributed to various projects in optoelectronic technology. His expertise in this field has allowed him to develop innovative solutions that address complex measurement challenges.

Collaborations

Throughout his career, Armin has collaborated with notable colleagues, including Jorg Worner and Thomas Müller. These partnerships have fostered a creative environment that has led to the development of cutting-edge technologies.

Conclusion

Armin Keinath's work in optoelectronics exemplifies the impact of innovation on technology and measurement. His patents and collaborations highlight his commitment to advancing the field and improving the accuracy of object profiling.

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