Wohlen, Switzerland

Armin Ineichen

This inventor holds 3 USPTO granted patents. Top assignee: Elpatronic Ag. Active years: 1994-1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Armin Ineichen. Retrieved from https://idiyas.com/inventor/armin-ineichen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.6

ph-index = 2

Forward Citations = 16(Granted Patents)


Company Filing History:


Years Active: 1994-1998

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3 patents (USPTO):Explore Patents

Title: Armin Ineichen: Innovator in Sheet Metal Processing

Introduction

Armin Ineichen is a notable inventor based in Wohlen, Switzerland. He has made significant contributions to the field of sheet metal processing, holding a total of 3 patents. His innovative approaches have enhanced the efficiency of metal handling and processing.

Latest Patents

Armin's latest patents include a device for the serial transport of sheet metal blanks towards processing. This invention outlines a process for removing individual metal sheets from a stack, allowing for the simultaneous removal of two sheets. The first sheet is positioned for transfer while a suction element retrieves the next sheet from the stack. This method significantly increases the destacking rate compared to previous techniques.

Career Highlights

Armin Ineichen has established himself as a key figure in his field through his work at Elpatronic AG. His expertise in metal processing technologies has led to advancements that benefit various manufacturing processes.

Collaborations

Armin collaborates with talented individuals such as Peter Gysi and Hanspeter Gysin, contributing to a dynamic work environment that fosters innovation.

Conclusion

Armin Ineichen's contributions to sheet metal processing exemplify the impact of innovative thinking in manufacturing. His patents and collaborative efforts continue to drive advancements in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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