Stamford, CT, United States of America

Arkadiy Belousov

This inventor holds 2 USPTO granted patents. Top assignees: International Business Machines Corporation, Micromuse Inc.. Active years: 2005-2008.


Average Co-Inventor Count = 4.0

ph-index = 2

Forward Citations = 127(Granted Patents)


Company Filing History:


Years Active: 2005-2008

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2 patents (USPTO):Explore Patents

Title: Innovations of Arkadiy Belousov

Introduction

Arkadiy Belousov is an accomplished inventor based in Stamford, CT, known for his contributions to network fault management systems. With a total of two patents to his name, he has made significant strides in reducing false alarms in computer networks.

Latest Patents

Belousov's latest patents focus on methods and systems designed to minimize false alarms in fault correlation software. These innovations involve monitoring various indicators that, when occurring together over a specific time window, can indicate the presence of a fault. By analyzing the transitions of these indicators, the system can determine the correlation of their states. This process helps to reduce the likelihood of false alarms, enhancing the reliability of network fault detection.

Career Highlights

Throughout his career, Arkadiy Belousov has worked with notable companies, including Micromuse Inc. and International Business Machines Corporation (IBM). His experience in these organizations has contributed to his expertise in network management and fault detection technologies.

Collaborations

Belousov has collaborated with several professionals in his field, including Louis A. Steinberg and Evan R. Wetstone. These partnerships have likely enriched his work and led to further advancements in his inventions.

Conclusion

Arkadiy Belousov's innovative work in network fault management systems showcases his dedication to improving technology and reducing operational inefficiencies. His patents reflect a commitment to enhancing the reliability of computer networks, making him a notable figure in the field of invention.

Profile summary based on public USPTO records.
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