This inventor holds 1 USPTO granted patent. Top assignee: California Institute of Technology. Active years: 2019.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2019
Title: Innovations of Ariel L. Furst in Electrochemical Detection
Introduction
Ariel L. Furst is an accomplished inventor based in Pasadena, California. He has made significant contributions to the field of electrochemical detection, particularly through his innovative patent. His work focuses on enhancing the accuracy of analyte detection using advanced substrate patterning techniques.
Latest Patents
Ariel L. Furst holds a patent for an invention titled "Electrochemical substrate patterning and analyte detection on a two-electrode platform." This two-electrode detection system is designed to work with target substrates, including nucleic acids, proteins, and small molecules, on specifically defined regions of a single surface. The spatial distribution of the target substrate on the surface allows for more accurate substrate interactions and analysis. Additionally, the detection system enables the patterning of different target substrates, thereby affording more precise analysis of multiple substrate targets.
Career Highlights
Ariel L. Furst is affiliated with the California Institute of Technology, where he continues to advance his research and innovations. His work has garnered attention for its potential applications in various scientific fields, including biochemistry and molecular biology.
Collaborations
Ariel collaborates with notable colleagues, including Michael G. Hill and Natalie B. Muren. Their combined expertise contributes to the development of cutting-edge technologies in the realm of electrochemical detection.
Conclusion
Ariel L. Furst's innovative work in electrochemical substrate patterning and analyte detection represents a significant advancement in the field. His contributions are poised to enhance the accuracy and efficiency of various analytical processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
