Ariel Hildesheim

Title: Innovations by Ariel Hildesheim in Optical Metrology

Introduction

Ariel Hildesheim is an accomplished inventor based in Milpitas, CA (US). He has made significant contributions to the field of optical metrology, particularly through his innovative patent. His work focuses on utilizing short-wave infrared wavelengths to enhance measurement techniques.

Latest Patents

Ariel Hildesheim holds a patent for an optical metrology tool that incorporates various illumination sources. This tool generates illumination with wavelengths both within and outside the short-wave infrared (SWIR) spectral range. The design includes illumination optics that direct the light to a sample, along with two imaging channels. The first imaging channel features a detector that captures images based on wavelengths in the SWIR range, while the second channel uses a detector for wavelengths outside this range. The controller processes images from both detectors to generate precise optical metrology measurements of the sample. This innovative approach enhances the accuracy and versatility of optical measurements.

Career Highlights

Ariel Hildesheim is currently employed at Kla Corporation, where he continues to develop cutting-edge technologies in optical metrology. His expertise and innovative mindset have positioned him as a valuable asset in the field.

Collaborations

Ariel has collaborated with notable colleagues, including Amnon Manassen and Isaac Salib, contributing to advancements in their shared field of expertise.

Conclusion

Ariel Hildesheim's contributions to optical metrology through his innovative patent demonstrate his commitment to advancing measurement technologies. His work continues to influence the industry and pave the way for future innovations.