Katwijk, Netherlands

Arie Zwaal

This inventor holds 1 USPTO granted patent. Top assignee: Agence Spatiale Europeene. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Arie Zwaal. Retrieved from https://idiyas.com/inventor/arie-zwaal

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Arie Zwaal: Innovator in Particle Measurement Technology

Introduction

Arie Zwaal is a notable inventor based in Katwijk aan Zee, Netherlands. She has made significant contributions to the field of particle measurement technology. Her innovative work has led to the development of a unique apparatus that measures particle fallout on surfaces.

Latest Patents

Arie Zwaal holds a patent for an "Apparatus for measuring particle fallout on a surface using a telltale." This invention showcases her expertise in creating solutions that address specific scientific challenges. The patent reflects her commitment to advancing technology in her field.

Career Highlights

Zwaal is currently associated with the European Space Agency, where she applies her skills and knowledge to various projects. Her role at the agency allows her to work on cutting-edge technologies that have a significant impact on space exploration and research.

Conclusion

Arie Zwaal is a pioneering inventor whose work in particle measurement technology exemplifies innovation and dedication. Her contributions continue to influence the scientific community and inspire future advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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