Freemont, CA, United States of America

Aravindkumar Ilangovan

This inventor holds 1 USPTO granted patent. Top assignee: Roku, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Aravindkumar Ilangovan. Retrieved from https://idiyas.com/inventor/aravindkumar-ilangovan-l4pytccr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Aravindkumar Ilangovan and Multimodal Asset Quality Management.

Introduction

Aravindkumar Ilangovan is an inventor associated with Roku, Inc., and is based in Fremont, California. His patent work addresses the evaluation of metadata quality for content-selection interfaces.

Latest Patents

Ilangovan is associated with 1 patent: “Asset Quality Management Using Multimodality.” The invention describes systems, methods, and software that assess metadata elements using a deep neural network trained to produce quality labels or scores. A large language model generates embeddings for training metadata, and similarity scores help identify examples labeled as “good” or “bad.” The labeled examples are then used to train the neural network through supervised learning.

Career Highlights

His disclosed patent focuses on combining language-model-generated asset embeddings with neural-network classification. This approach is designed to help evaluate metadata for use in a graphical interface that supports content selection.

Collaborations

The provided information identifies Roku, Inc. as Ilangovan’s company and Jinesh Dineshbhai Patel as a coworker. The patent description concerns a system for assessing metadata quality, but the supplied details do not specify individual contributions or the nature of their collaboration.

Conclusion

Aravindkumar Ilangovan’s patent work at Roku, Inc. centers on using multimodal machine-learning techniques to assess metadata quality and support content selection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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